Scan Analyzer

In this application the iScope is used as a low cost Chip Tester Emulator. Most modern ASICs use compressed test patterns to reduce tester time. These test patterns, however, are hard to debug, since there is no longer a direct one-to-one correlation between the test pattern and the flop number in the scan chain. With the Scan analyzer capabilities in the iScope, it is possible to inject test patterns into the scan chain on a cycle by cycle basis, switch the ASIC into capture mode, then scan out the uncompressed patterns and compare them with a set of golden reference. In this manner, the location of the faulty flop or flops can be spotted very efficiently.